{"id":203,"date":"2016-02-08T14:41:56","date_gmt":"2016-02-08T19:41:56","guid":{"rendered":"http:\/\/caslabs.case.edu\/burda\/?page_id=203"},"modified":"2016-05-25T10:08:51","modified_gmt":"2016-05-25T14:08:51","slug":"material-characterization","status":"publish","type":"page","link":"https:\/\/caslabs.case.edu\/burda\/material-characterization\/","title":{"rendered":"Material Characterization"},"content":{"rendered":"<p>A 300kV Field-Emission Gun Energy-Filtering High-Resolution Scanning Transmission Electron Microscope Tecnai F30 is available for HRTEM characterization:<\/p>\n<p><img loading=\"lazy\" class=\"size-full wp-image-204 aligncenter\" src=\"https:\/\/artscimedia.case.edu\/wp-content\/uploads\/sites\/174\/2016\/02\/14222119\/fieldEmissionGun_burda_materials1.jpg\" alt=\"fieldEmissionGun_burda_materials1\" width=\"346\" height=\"331\" \/><\/p>\n<p>The 300kV field-emission gun energy-filtering high-resolution analytical scanning transmission electron microscope Tecnai F30 (made by FEI) in the Center for Surface Analysis of Materials (CSAM) at CWRU.<\/p>\n<hr \/>\n<p>A 200kV Conventional Analytical Transmission Electron Microscope (Philips CM20) is used for everyday-work and all Ph.D. candidates are trained by Research Scientist John Sears to use it:<\/p>\n<p><img loading=\"lazy\" class=\"size-full wp-image-205 aligncenter\" src=\"https:\/\/artscimedia.case.edu\/wp-content\/uploads\/sites\/174\/2016\/02\/14222118\/electronMicrosope.jpg\" alt=\"electronMicrosope\" width=\"253\" height=\"336\" \/><\/p>\n<p>The Philips CM20 transmission electron microscope has an accelerating voltage of 200 kV and is equipped with a LaB6 filament and a side-entry stage. This instrument is particularly suitable for CTEM (conventional TEM), including bright-field imaging, dark-field imaging, and weak-beam dark-field imaging of defects in crystalline materials.<\/p>\n<hr \/>\n<p>The X-Ray Photo-Electron Spectrometry System Perkin-Elmer PHI-5600 allows for surface compositional analysis and is heavily in use for our nanomaterials doping projects:<\/p>\n<p><img loading=\"lazy\" class=\"size-full wp-image-206 aligncenter\" src=\"https:\/\/artscimedia.case.edu\/wp-content\/uploads\/sites\/174\/2016\/02\/14222115\/xps_burda_materials3.jpg\" alt=\"xps_burda_materials3\" width=\"324\" height=\"272\" \/><br \/>\nThe Perkin-Elmer PHI-5600 XPS (X-ray photo-electron spectrometry or &#8220;ESCA,&#8221; &#8220;electron spectroscopy for chemical analysis&#8221;) system includes a conventional dual anode X-ray source (Mg and Al), a 50 cm hemispherical electron energy analyzer, a XYZT sample stage with eight sample storages, and an inert gas sputtering source (PHI-04-303) for sample cleaning and depth profiling.<\/p>\n<hr \/>\n<p>&nbsp;<\/p>\n<p>For Structural Ananlysis An Advanced Diffraction System Scintag X-1 is Used on Everyday Basis:<\/p>\n<p><img loading=\"lazy\" class=\"size-full wp-image-207 aligncenter\" src=\"https:\/\/artscimedia.case.edu\/wp-content\/uploads\/sites\/174\/2016\/02\/14222115\/structuralAnalysis.jpg\" alt=\"structuralAnalysis\" width=\"268\" height=\"336\" \/><\/p>\n<p style=\"text-align: left\">The Scintag X-1 advanced X-ray diffractometer is available for X-ray diffraction experiments. Normal theta-theta scans are routine, but it is also possible to record rocking curves and sample-tilting curves.<\/p>\n","protected":false},"excerpt":{"rendered":"<p>A 300kV Field-Emission Gun Energy-Filtering High-Resolution Scanning Transmission Electron Microscope Tecnai F30 is available for HRTEM characterization:<\/p>\n<p>The 300kV field-emission gun energy-filtering high-resolution analytical scanning transmission electron microscope Tecnai F30 (made by FEI) in the Center for Surface Analysis of Materials (CSAM) at CWRU.<\/p>\n<p>A 200kV Conventional Analytical Transmission Electron Microscope (Philips CM20) is used for everyday-work and all Ph.D. candidates are trained by Research Scientist John Sears to use it:<\/p>\n<p>The Philips CM20 transmission electron microscope has an accelerating voltage of 200 kV and is equipped with a LaB6 filament and a side-entry stage.<\/p>\n<p><a href=\"https:\/\/caslabs.case.edu\/burda\/material-characterization\/\" class=\"more-link\">Continue reading&#8230; <span class=\"screen-reader-text\">Material Characterization<\/span><\/a><\/p>\n","protected":false},"author":19,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"spay_email":""},"_links":{"self":[{"href":"https:\/\/caslabs.case.edu\/burda\/wp-json\/wp\/v2\/pages\/203"}],"collection":[{"href":"https:\/\/caslabs.case.edu\/burda\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/caslabs.case.edu\/burda\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/caslabs.case.edu\/burda\/wp-json\/wp\/v2\/users\/19"}],"replies":[{"embeddable":true,"href":"https:\/\/caslabs.case.edu\/burda\/wp-json\/wp\/v2\/comments?post=203"}],"version-history":[{"count":1,"href":"https:\/\/caslabs.case.edu\/burda\/wp-json\/wp\/v2\/pages\/203\/revisions"}],"predecessor-version":[{"id":208,"href":"https:\/\/caslabs.case.edu\/burda\/wp-json\/wp\/v2\/pages\/203\/revisions\/208"}],"wp:attachment":[{"href":"https:\/\/caslabs.case.edu\/burda\/wp-json\/wp\/v2\/media?parent=203"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}